Department of Pattern Recognition

Conference Paper (international conference)

The features for recognition of projectively deformed point sets

Suk Tomáš, Flusser Jan

: Proceedings of the IEEE International Conference on Image Processing, p. 348-351 , Eds: Werner B.

: IEEE, (Washington 1995)

: ICIP '95, (Washington, US, 23.10.1995-26.10.1995)

: 102/94/1835, GA ČR

: http://library.utia.cas.cz/prace/950144.ps

: 09K